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Ellipsometer L117 No.166-AK

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UV-Vis spectrometer

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Evaporation system with three magnetronic sources

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Ceramic powder tablets formation device 99999-/F307

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Dark field microscope with extras NIKON Eclipse LV100D

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Raman spectroscopy system

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The CR-400 handheld chroma meter (color measuring instrument )

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High temperature electric tube furnace SNOL 7/1300L with E5CK control program

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High speed scanning acoustic microscope KSI-V8  for high-frequency ultrasonic studies in water to investigate the internal structure of various metals and their alloys, carbon and glass-fibre-reinforced composite materials, metal composites, plastics and their alloys, and to search for internal defects. Also for the study of the internal structure of electronic components and biological objects.

Description:

A laser ellipsometer is a precision optical instrument used to measure the thickness and optical properties of thin films on surfaces. It employs polarized laser light, which reflects off the sample, and analyzes changes in the polarization state to determine parameters such as refractive index and film thickness. This non-destructive technique is widely used in materials science, semiconductor manufacturing, and surface chemistry for characterizing surfaces at the nanometer scale.

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Transmittance, absorbance and luminescence measurements in UV-VIS spectral range. Liquids can be analyzed in the standard cuvette, hard transparent samples

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3D printer - Alfawise W10

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Raman spectroscope

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Laser marking system

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The Nova II is a very versatile and sophisticated handheld laser power/energy meter.

• Large high definition LCD display
• Compatible with standard Ophir thermal, BeamTrack, pyroelectric
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Description:

The device is capable of analyzing the optical constants (k(λ), n(λ)) and measuring the thickness of thin layers, both isotropic and anisotropic, on a wide range of substrates, whether transparent or opaque. It is suitable for examining non-transparent materials as well. Additionally, the system supports the evaluation of periodic structures (scatterometry) and can be used to monitor absorption kinetics in liquids.

Description:

The Raith e-Line Plus is an advanced electron beam lithography system designed for high-precision nanofabrication and nanoscale patterning. It features a versatile platform with a high-resolution electron beam column, capable of achieving feature sizes down to the sub-10 nanometer range. The Raith e-Line Plus has a user-friendly interface and comprehensive software suite, facilitating efficient and accurate design-to-device workflows. The system is also capable of scanning electron microscopy (SEM) and surface chemical analysis (EDX) from Be (Z=4) to Am (95).

The system is installed in a class ISO5 cleanroom.

Description:

The OAI Hybralign Series 204IR is a mask aligner system used for parallel exposure wafers and wafer chips through a photomask to define microsctructures in UV sensitive resists. It features near-UV and deep-UV operating modes, an IR backside alignment system, and a UV nanoimprint add-on.

The system is installed in a class ISO5 cleanroom.

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Description:

ICP RIE system PlasmaTherm Apex SLR is used for the reactive ion etching of a variety of materials, most commonly Si/SiO2. It is equipped with fluorine-based gases and a cryo-cooled electrode, which enabled deep reactive ion etching (DRIE) of silicon. ICP RIE systems have two independent RF power supplies: one controls capacitive coupled plasma and the resulting self-bias, whereas the other supplies power to an antenna coil, inducing an inductively coupled plasma. This type of setup decouples the plasma density control (ICP) from the ion energy (CCP), allowing to achieve much higher etch rates without sacrificing selectivity.

Description:
The service covers the diagnostics of transformer insulation condition and the assessment of transformer compliance with international and European standards. Using the Omikron TESTRANO transformer testing system, measurements of winding resistance, turns ratio, insulation resistance, dissipation factor (tanδ), capacitance and sweep frequency response analysis (SFRA) are carried out. In the high voltage laboratory, AC and DC high voltage tests, partial discharge measurements and breakdown voltage determination are performed. Using the impulse generator, lightning and switching impulse voltage tests are conducted in accordance with IEC and IEEE standards. All results are compared against standard requirements and an expert conclusion on the transformer condition and suitability for operation is provided.

Description:
The service covers the creation, modelling and analysis of digital twins of electrical power systems, microgrids and hybrid energy systems. Using specialised hardware and software, accurate physical-mathematical models are developed to monitor, predict and optimise the operational parameters of real energy systems.

Description:

Chromatography (HPLC) system with a mass spectrometry (MS) detector and elemental analysis

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Equipment for forming the layers, integrated in an inert atmosphere chamber.

Description:

LuQY Pro is a compact, user-friendly, and non-invasive system designed for fast and reliable quantification of Electroluminescence (EL), Photoluminescence Quantum Yield (PLQY), and implied Open-Circuit Voltage (iVOC / Quasi-Fermi Level Splitting – QFLS) in thin film absorbers, such as hybrid halide perovskites, layer stacks, or complete photovoltaic devices under a variety of operating conditions.