XPS: X-Ray photoelectron spectroscopy and Auger electron spectroscopy system - KRATOS XSAM800
Description:

Quantitative and qualitative surface analysis  using X-Ray photoelectron spectroscopy and Auger electron spectroscopy  

Keywords:
Quantitative and qualitative surface analysis, X-Ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES)

Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy, Featured research equipment
Technical specification:

X-ray sorce - double Al/Mg anode. Area of analysis: 10 mm. Elements detection limits from 0.1% to 5%

Usage area:
material characterization and analysis
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