AFM: Scanning probe microscopy system - JPK NanoWizard 3
Description:
The JPK NanoWizard 3 scanning probe microscopy system is used for measuring surface topography and the mechanical, electrical, and magnetic properties of materials in both air and fluids. It is suitable for solids, polymers, biological samples, and molecular characterization, as well as for nanomanipulation and nanolithography. This system supports the development and research of advanced new materials and thin films, and it aids in the control of technological processes at the nanoscale.
The system is installed in a class ISO5 cleanroom.
Keywords:
imaging, atomic force microscopy (AFM), topography, morphology, microscopy
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
- Operating modes:
- contact,
- intermittent contact/AC/tapping,
- non-contact,
- Lateral force microscopy
- Phase imaging
- Force mapping
- Quantitative imaging:
- images of the surface force curve,
- the force-distance spectroscopy of force-distance volumetric imaging mode,
- conductivity microscopy
- Scanning field: <100x100 μm2
- Height: <15 μm
Usage area:
material characterization and analysis, microscopy and imaging
material characterization and analysis, microscopy and imaging