Raman scattering spectrometer - Renishaw inVia
Description:

Setup with the confocal micro-Raman optical system is devoted for Raman scattering spectra registration. Raman scattering spectroscopy can be used for the analysis of bulk materials, thin layers, powder and solutions. Unknown materials can be identified using the 8000 spectra containing spectral library. Measurements of various carbon allotropes (diamond-type carbon, graphene, graphene oxide), organic and inorganic materials, surface-enhanced Raman scattering measurements using silver or gold nanoparticles are performed.

Keywords:
Raman spectroscopy, materials research, identification

Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
  • 532 nm semiconductor laser:
    • Power: 45 mW
    • Grating: 2400 lines / mm
  • 785 nm diode laser
    • Power: 100 mW
    • Grating: 1200 lines / mm  
  • 1024 pixels thermoelectrically cooled CCD detector
  • Stokes lines measuring range: 100 cm-1 - 8000 cm-1  
  • Resolution: 1 cm-1
  • Leica confocal microscope:
    • Objectives: 5x, 20x, 50x and 100x
    • High speed encoded stage with step sizes down to 50 nm
  • Spectral library containing 8000 spectra  
Usage area:
material characterization and analysis
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