System for charge mobility measurements
Description:
System for charge mobility measurements

Keywords:
charge mobility

Field of Science:
New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
CELIV method, max voltage 10V, TOF method max voltage 1000V. Excitation is done with 276 nm, 355 nm, 530 nm light by nanosecond laser.
Usage area:
Investigation of charge transport properties of organic semiconductors
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