Raman scattering spectrometer Renishaw in Via Spectrometer with accessories
Description:
Raman scattering spectrometer Renishaw in Via Spectrometer with accessories

Keywords:
Raman spectroscopy, materials research, identification

Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
532 nm, 45 mW semiconductor laser awaking 2400 lines / mm grating, termoelektriškai 1024 pixels cooled CCD Stokes lines measuring range from 100 cm-1 to 8000 cm-1 resolution - better than 1 cm -1. Leica confocal microscope with 3 lenses x20, x50 and x100.
Usage area:
Raman scattering spectroscopy can be used for thin layers of powder and aqueous solutions of the investigation. In addition to information about the structure of materials, Raman spectroscopy can be used for some types of stress in thin layers of review. Software complex for Raman scattering spectra in the confocal micro-Raman optical system and luminescence measurements.
Request form