Description:
Energy-dispersive X-ray spectroscopy (EDS or EDX) is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing unique set of peaks on its X-ray emission spectrum. To stimulate the emission of characteristic X-rays from a specimen, a high-energy beam of charged particles such as electrons or protons, or a beam of X-rays, is focused into the sample being studied. Technical specifications: Detector - SDD (Silicon Drift Detector), energy resolution - 133, 129 and 127 eV (Mn Ka) 1 100 000 cps Calculation stretch - 1 000 000. or more active area - 10 mm2 detectable elements - from boron (5) to americium (95) or better.

Field of Science:
Diagnostic and measurement technologies, Smart environments and information technology