Description:

Computed tomography (CT) is an imaging procedure that uses X–ray source to irradiate the object at different angles and 2D images at a flat panel detector are recorded. Later 3D images of the density distribution inside the object are reconstructed. The computerized tomography calculation allows the 3D reconstruction of the measured volumetric data inside the object.  Up to 3 μm resolution can be achieved.

Description:

Analyzer for determine the total organic carbon, the water sample is oxidized at 680 °C (non-dispersive infrared detection (NDIR) method) . The amount of CO2 released during oxidation is measured and used for calculations.

Description:

Transmittance, absorbance and luminescence measurements in UV-VIS spectral range. Liquids can be analyzed in the standard cuvette, hard transparent samples

Description:

The polymer electrohydrodynamic processing device is designed to form polymeric (various polymers available) nano / micro structures.

Description:

Salt (fog) spray corrosion test chamber can be used for all kinds of material surface treatment, including coating, electroplating, organic and inorganic coating, anodizing, rust proof oil and preservative treatment test of its corrosion resistance, so as to establish the quality of the products.

Description:

Vacuum drying oven For sample drying or storing at specific conditions 

Description:

The Nova II is a very versatile and sophisticated handheld laser power/energy meter.

• Large high definition LCD display
• Compatible with standard Ophir thermal, BeamTrack, pyroelectric & photodiode sensors
• Choice of digital or analog needle display
• Backlighting and rechargeable battery
• Soft keys and menu driven functions with on line help
• Non-volatile data storage up to 59,400 points

Description:
UV-Vis spectrometer

Description:

Infrared thermometer 

Description:

A laser ellipsometer is a precision optical instrument used to measure the thickness and optical properties of thin films on surfaces. It employs polarized laser light, which reflects off the sample, and analyzes changes in the polarization state to determine parameters such as refractive index and film thickness. This non-destructive technique is widely used in materials science, semiconductor manufacturing, and surface chemistry for characterizing surfaces at the nanometer scale.