Dark field microscope with extras NIKON Eclipse LV100D
Description:
Dark field microscope with extras NIKON Eclipse LV100D

Keywords:
diffused light spectra, dark field

Field of Science:
Diagnostic and measurement technologies
Technical specification:
Spectrum resolution: 1.5 nm; measurement boundaries: 400-900 nm
Usage area:
Investigation of nanoparticles in ultra-thin films
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