Measurements and Investigation of Surface Structures of Micro-nano Structures
Description:
We perform surface structure measurements and studies of micro and nano structures using atomic force microscopes (AFM) or scanning probe microscopes (SPM). These devices allow for precise capture of surface topography with nanometer accuracy by mechanical probe scanning. Technical specifications include the largest scan area of 110 × 110 µm, the largest surface height of 22 µm, vertical resolution accuracy Z 0.34 nm and horizontal resolution accuracy XY 1.4 nm. The collected data is used for the analysis of surface roughness, structures, defects and nanostructural elements. The service is intended for both scientific research and industrial needs, providing the opportunity to develop advanced surface treatment processes and new material design solutions.
We perform surface structure measurements and studies of micro and nano structures using atomic force microscopes (AFM) or scanning probe microscopes (SPM). These devices allow for precise capture of surface topography with nanometer accuracy by mechanical probe scanning. Technical specifications include the largest scan area of 110 × 110 µm, the largest surface height of 22 µm, vertical resolution accuracy Z 0.34 nm and horizontal resolution accuracy XY 1.4 nm. The collected data is used for the analysis of surface roughness, structures, defects and nanostructural elements. The service is intended for both scientific research and industrial needs, providing the opportunity to develop advanced surface treatment processes and new material design solutions.
Keywords:
laboratoriniai tyrimai,mikroskopija,nanodangos,struktūrinė analizė
Field of Science:
New production processes, materials and energy efficiency
New production processes, materials and energy efficiency