PTVF

Surface morphology and structure
Description:
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image.

Keywords:
Structure, SEM

Field of Science:
Diagnostic and measurement technologies, Smart environments and information technology
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