XPS: Universal X-Ray photoelectron and ion scatering spectroscopy surface analysis system - ThermoFisher ESCALAB 250Xi
Description:
The ThermoFisher ESCALAB 250Xi is an advanced surface analysis tool designed for both qualitative and quantitative investigations of material surfaces. Utilizing X-ray photoelectron spectroscopy (XPS), ion scattering spectroscopy (ISS), and reflection electron energy loss spectroscopy (REELS), this system provides comprehensive insight into surface chemistry and electronic structure. The addition of angle-resolved XPS (ARXPS) allows for depth profiling, while an Ar ion beam enables precise surface cleaning and etching.
Keywords:
X-Ray photoelectron spectroscopy, ion scatering spectroscopy, electron spectroscopy, reflection electron energy loss spectroscopy, Angle Resolved XPS (ARXPS)
Field of Science:
Featured research equipment, ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Featured research equipment, ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Technical specification:
- X-Ray Source: Monochromated X-ray (Al anode)
- Element Detection Limits: 0.1% to 5%
- Lateral Resolution (Lens-Defined Area): Adjustable from 20 µm to 900 µm
- High-Resolution Imaging: Spectra from areas as small as ~5 µm
- Sample Temperature Control:
- Heating up to 1000 K
- Cooling down to 77 K
- Vacuum Performance: Better than 5E-10 mbar
- Surface Cleaning/Etching: Ar ion sputtering for surface preparation
Usage area:
material characterization and analysis
material characterization and analysis