XRD: X-ray diffractometer D8 Discover, Bruker
Description:
X-ray diffractometer D8 Discover, Bruker
X-ray diffractometer D8 Discover, Bruker
Keywords:
X-ray diffraction, structure, thin layers, analysis of chemical compounds
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
Specification: 2.2 kW X-ray tube with Cu anode. Parallel beam/ Bragg-Brentano geometry, Göbel mirror, 2xGe(022) crystal monochromator, rotary absorber, scintillation detector, 1D LynxEye detector, Eulerian cradle (X, Y, Z, Psi, Phi), Chi ir Xi motorized positioning table, X-ray reflectivity acessory, motorized slit accessory, PATHFINDER optics.
Specification: 2.2 kW X-ray tube with Cu anode. Parallel beam/ Bragg-Brentano geometry, Göbel mirror, 2xGe(022) crystal monochromator, rotary absorber, scintillation detector, 1D LynxEye detector, Eulerian cradle (X, Y, Z, Psi, Phi), Chi ir Xi motorized positioning table, X-ray reflectivity acessory, motorized slit accessory, PATHFINDER optics.
Usage area:
Qualitative and quantitative analysis of chemical compounds; Ab initio-crystal structure of chemical compounds to identify and clarify; Material microstructure analysis (crystallite sizes, micro-stress, to determine the degree of crystallinity); X-ray diffraction measurements at a sliding angle of the focused (GID); Micro-Diffraction measurements; Small reflectometry and high resolution
Qualitative and quantitative analysis of chemical compounds; Ab initio-crystal structure of chemical compounds to identify and clarify; Material microstructure analysis (crystallite sizes, micro-stress, to determine the degree of crystallinity); X-ray diffraction measurements at a sliding angle of the focused (GID); Micro-Diffraction measurements; Small reflectometry and high resolution