SEM: Scanning electron microscope - FEI Quanta 200 FEG
Description:
This scanning electron microscope (SEM) offers versatile imaging capabilities across various vacuum regimes, enabling high-resolution imaging of both conductive and non-conductive materials. Its ability to operate under different pressures, including high and low vacuum, as well as Environmental SEM (ESEM) conditions, makes it suitable for analyzing a wide range of samples with exceptional precision.
Keywords:
Microscope, magnification, visualization, scanning electron microscope, SEM, electron microscope, secondary electrons, back scattered electrons, environmental SEM, ESEM, field emission gun, FEG
Field of Science:
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Technical specification:
- Resolution:
- Up to 1.2 nm (30 kV, SE) in high vacuum
- Up to 2.5 nm (30 kV, BSE) in high vacuum
- Up to 3 nm (1 kV, SE) in high vacuum
- Vacuum Regimes:
- High Vacuum: <6E-4 Pa
- Low Vacuum: 10–130 Pa
- ESEM: 10–4000 Pa
- Sample Compatibility: Suitable for both conductive and insulating samples
Usage area:
material characterization and analysis, microscopy and imaging
material characterization and analysis, microscopy and imaging