Scanning electron microscope
Description: Scanning electron microscope

Keywords: Microscope, magnification, visualization, scanning electron microscope, SEM, electron microscope, secondary electrons, back scattered electrons, environmental SEM, ESEM, field emission gun, FEG

Field of Science: Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification: Resolution in high vacuum up to 1.2 nm (30 kV, SE), up to 2.5 nm (30 kV, BSE) and up to 3 nm (1 kV, SE). Three available vacuum regimes: high vacuum (<6E-4 Pa), low vacuum (10-130 Pa), ESEM (10-4000 Pa). Conductive and isolating samples can be investigated.
Usage area: Sample vizualization
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