Scanning electron microscope
Description:
Scanning electron microscope
Scanning electron microscope
Keywords:
Microscope, magnification, visualization, scanning electron microscope, SEM, electron microscope, secondary electrons, back scattered electrons, environmental SEM, ESEM, field emission gun, FEG
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
Resolution in high vacuum up to 1.2 nm (30 kV, SE), up to 2.5 nm (30 kV, BSE) and up to 3 nm (1 kV, SE). Three available vacuum regimes: high vacuum (<6E-4 Pa), low vacuum (10-130 Pa), ESEM (10-4000 Pa). Conductive and isolating samples can be investigated.
Resolution in high vacuum up to 1.2 nm (30 kV, SE), up to 2.5 nm (30 kV, BSE) and up to 3 nm (1 kV, SE). Three available vacuum regimes: high vacuum (<6E-4 Pa), low vacuum (10-130 Pa), ESEM (10-4000 Pa). Conductive and isolating samples can be investigated.
Usage area:
Sample vizualization
Sample vizualization