MMI

Electron beam lithography, electron microscope, energy dispersive spectroscopy

Description:
Electron beam lithography, electron microscope, energy dispersive spectroscopy

KRATOS molecular beam epitaxy system for GaAs with control.

Description:

KRATOS molecular beam epitaxy system for GaAs with control.

Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)

Description:
Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)

Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800

Description:

Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800