SEM: Scanning electron microscope - FEI Quanta 200 FEG
Description:
This scanning electron microscope (SEM) offers versatile imaging capabilities across various vacuum regimes, enabling high-resolution imaging of both conductive and non-conductive materials. Its ability to operate under different pressures, including high and low vacuum, as well as Environmental SEM (ESEM) conditions, makes it suitable for analyzing a wide range of samples with exceptional precision.
Keywords:
Microscope, magnification, visualization, scanning electron microscope, SEM, electron microscope, secondary electrons, back scattered electrons, environmental SEM, ESEM, field emission gun, FEG
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Technical specification:
- Resolution:
- Up to 1.2 nm (30 kV, SE) in high vacuum
- Up to 2.5 nm (30 kV, BSE) in high vacuum
- Up to 3 nm (1 kV, SE) in high vacuum
- Vacuum Regimes:
- High Vacuum: <6E-4 Pa
- Low Vacuum: 10–130 Pa
- ESEM: 10–4000 Pa
- Sample Compatibility: Suitable for both conductive and insulating samples
Usage area:
material characterization and analysis, microscopy and imaging
material characterization and analysis, microscopy and imaging