This service provides a comprehensive suite of electrical, dielectric, and optical parameter measurements tailored for materials science and optoelectronics applications. Utilizing the Keithley 6487 picoammeter and a four-point probe system, we perform precise current-voltage (I-V) characterization and resistivity measurements to evaluate conductor and semiconductor properties. Dielectric spectroscopy is conducted via the Novocontrol Alpha-AK impedance analyzer, determining electrical conductivity and permittivity across a broad frequency range. The service integrates laser system diagnostics using the Ophir Nova II meter for power and energy registration, alongside the DataRay WinCamD-LCM camera for beam profile analysis. Additionally, non-contact temperature measurements and experiments within controlled gas flow environments are available, facilitating sensor testing and material stability studies under specific atmospheric conditions.
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New production processes, materials and energy efficiency