MMI

Electrical characterization of materials
Description:
This service provides a comprehensive suite of electrical, dielectric, and optical parameter measurements tailored for materials science and optoelectronics applications. Utilizing the Keithley 6487 picoammeter and a four-point probe system, we perform precise current-voltage (I-V) characterization and resistivity measurements to evaluate conductor and semiconductor properties. Dielectric spectroscopy is conducted via the Novocontrol Alpha-AK impedance analyzer, determining electrical conductivity and permittivity across a broad frequency range. The service integrates laser system diagnostics using the Ophir Nova II meter for power and energy registration, alongside the DataRay WinCamD-LCM camera for beam profile analysis. Additionally, non-contact temperature measurements and experiments within controlled gas flow environments are available, facilitating sensor testing and material stability studies under specific atmospheric conditions.

Keywords:
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Field of Science:
New production processes, materials and energy efficiency
Impedance analyzer - Novocontrol Alpha-AK
Picoammeter / DC source - Keithley 6487
Four-point probe measurement system
Laser power meter - Ophir Nova II
Infrared thermometer - UNI-T UT302D
Beam profiler - DataRay WinCamD-LCM
Two-channel electrical measurement system with gas flow control
Digital osciloscope - Siglent SDS6104A
Atmospheric pressure gas mass spectrometer - Pfeiffer Vacuum OmniStar GSD 350 O1
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