MMI

Material Characterization using optical spectroscopy
Description:
This service provides comprehensive material and surface investigation using non-destructive optical methods. The facility employs vibrational spectroscopy techniques, including Raman scattering (Renishaw inVia) and Fourier Transform Infrared spectroscopy (FTIR, Bruker Vertex 70), to identify chemical compounds, functional groups, and molecular structures. For the analysis of thin films and coatings, spectroscopic (Semilab GES5-E) and laser (Gaertner L115) ellipsometry are utilized to determine refractive indices and layer thicknesses with nanometer-scale precision. Spectral analysis in the ultraviolet, visible, and near-infrared regions is conducted using fiber-optic spectrometers. The service also includes photovoltaic characterization using a solar spectrum simulator, differential absorption measurements, and surface gloss assessment for industrial applications.

Keywords:
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Field of Science:
New production processes, materials and energy efficiency
Fiber optic spectrometer - Avantes AvaSpec-2048
FTIR: Fourier transform infrared spectrometer - Bruker Vertex 70
Solar spectrum simulator
Fiber optic spectrometer
Laser ellipsometer - Gaertner L115
Universal optical spectroscopy and laser microfabrication system
Fiber optic spectrometer - CMA 012
Spectroscopic ellipsometer - Semilab GES5E
Glossmeter - Elcometer 480
Raman scattering spectrometer - Renishaw inVia
Supercontinuum fiber laser platform with variable bandwidth tunable wavelength filter - NKT Photonics SuperK EVO HP EU-4 and SuperK VARIA
Spectroscopic detector with monochromator - Andor Kymera 193i and Newton EMCCD DU970P-BVF
Optical spectrum analyzer - Yokogawa AQ6373E-10-L1-F
UV-Vis-NIR spectrophotometer with accessories - Jasco V-770
Nanoparticle size and Zeta-potential analyzer - Malvern Panalytical Zetasizer Ultra Red
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