This service provides comprehensive material and surface investigation using non-destructive optical methods. The facility employs vibrational spectroscopy techniques, including Raman scattering (Renishaw inVia) and Fourier Transform Infrared spectroscopy (FTIR, Bruker Vertex 70), to identify chemical compounds, functional groups, and molecular structures. For the analysis of thin films and coatings, spectroscopic (Semilab GES5-E) and laser (Gaertner L115) ellipsometry are utilized to determine refractive indices and layer thicknesses with nanometer-scale precision. Spectral analysis in the ultraviolet, visible, and near-infrared regions is conducted using fiber-optic spectrometers. The service also includes photovoltaic characterization using a solar spectrum simulator, differential absorption measurements, and surface gloss assessment for industrial applications.
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New production processes, materials and energy efficiency