Structure and chemical composition analysis via X-Ray methods
Description:
This service encompasses comprehensive material analysis utilizing X-ray radiation techniques to investigate both bulk structure and surface properties. The Bruker D8 DISCOVER diffractometer facilitates crystallographic structure determination, phase identification, and thin-film investigation. For surface chemical analysis, X-ray Photoelectron Spectroscopy (XPS) systems, specifically the ThermoFisher ESCALAB 250Xi and KRATOS XSAM800, are employed to determine elemental composition and chemical bonding states at the nanometer scale. The inclusion of Auger electron spectroscopy capabilities allows for enhanced local surface examination. Additionally, the Bruker Quantax Energy Dispersive Spectrometer (EDS) enables rapid elemental analysis and distribution mapping at the micron level. This combination of spectroscopic and diffractometric methods ensures a holistic characterization of material structure and surface chemistry suitable for diverse scientific applications.
This service encompasses comprehensive material analysis utilizing X-ray radiation techniques to investigate both bulk structure and surface properties. The Bruker D8 DISCOVER diffractometer facilitates crystallographic structure determination, phase identification, and thin-film investigation. For surface chemical analysis, X-ray Photoelectron Spectroscopy (XPS) systems, specifically the ThermoFisher ESCALAB 250Xi and KRATOS XSAM800, are employed to determine elemental composition and chemical bonding states at the nanometer scale. The inclusion of Auger electron spectroscopy capabilities allows for enhanced local surface examination. Additionally, the Bruker Quantax Energy Dispersive Spectrometer (EDS) enables rapid elemental analysis and distribution mapping at the micron level. This combination of spectroscopic and diffractometric methods ensures a holistic characterization of material structure and surface chemistry suitable for diverse scientific applications.
Keywords:
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Field of Science:
New production processes, materials and energy efficiency
New production processes, materials and energy efficiency
EDS: X-Ray energy dispersion spectrometer - Bruker Quantax
XPS: X-Ray photoelectron spectroscopy and Auger electron spectroscopy system - KRATOS XSAM800
XRD: X-ray diffractometer - Bruker D8 Discover
XPS: Universal X-Ray photoelectron and ion scatering spectroscopy surface analysis system - ThermoFisher ESCALAB 250Xi