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Scanning electron microscope
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Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800
Description: Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800 |
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XRD: X-ray diffractometer D8 Discover, Bruker
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Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)
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KRATOS molecular beam epitaxy system for GaAs with control.
Description: KRATOS molecular beam epitaxy system for GaAs with control. |
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Electron beam lithography, electron microscope, energy dispersive spectroscopy
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Atomic force microscope NT-206
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Energy dispersive X-Ray analysis
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Optical and fluorescence microscope
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Lloyd`s mirror holographic lithography setup.
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solar spectra simulator
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vacuum evaporation unit
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vacuum evaporation unit
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RF reactive ion etching system
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ion etching system
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diamond like carbon ion beam synthesis system
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Spin coater for the formation of thin layers
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Dot-matrix hologram origination system
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Device for multiplication of optical security marks MSM-1
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impedance analyzer
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Mask aligner and nanoimprint lithography
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picoammeter / bias source
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Raman scattering spectrometer Renishaw in Via Spectrometer with accessories
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Device for replication of holograms
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dynamic microhardness meter
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vacuum evaporation unit
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Spincoater, hotplate and UV curing lamp for formation of thin films
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ICP deep reactive etching system,
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Device for multiplication of holograms
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Laser ellipsometer L115
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Device for roughness measurement of mechanical surfaces
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Langmuir-Blodgett trough and control system
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UV-VIS spektrometer
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Universal optical spectroscopy and laser microfabrications system
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AFM Scanning probe microscopy system JPK NanoWizard 3
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Spectroscopic ellipsometer
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The fiber-optic
spectrometer AvaSpec-2048
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Optical microscope NIKON (analyzer)
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microwave plasma enhanced chemical vapor deposition system
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Device for galvanoplastic multiplication
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Fourier transform infrared spectrometer
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