Scanning electron microscope
Description: |
![]() |
Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800
Description: Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800 |
![]() |
XRD: X-ray diffractometer D8 Discover, Bruker
Description: |
![]() |
Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)
Description: |
![]() |
KRATOS molecular beam epitaxy system for GaAs with control.
Description: KRATOS molecular beam epitaxy system for GaAs with control. |
![]() |
Electron beam lithography, electron microscope, energy dispersive spectroscopy
Description: |
![]() |
Atomic force microscope NT-206
Description: |
![]() |
Energy dispersive X-Ray analysis
Description: |
![]() |
Optical and fluorescence microscope
Description: |
![]() |
Lloyd`s mirror holographic lithography setup.
Description: |
![]() |
solar spectra simulator
Description: |
![]() |
vacuum evaporation unit
Description: |
![]() |
vacuum evaporation unit
Description: |
![]() |
RF reactive ion etching system
Description: |
![]() |
ion etching system
Description: |
![]() |
diamond like carbon ion beam synthesis system
Description: |
![]() |
Spin coater for the formation of thin layers
Description: |
![]() |
Dot-matrix hologram origination system
Description: |
![]() |
Device for multiplication of optical security marks MSM-1
Description: |
![]() |
impedance analyzer
Description: |
![]() |
Mask aligner and nanoimprint lithography
Description: |
![]() |
picoammeter / bias source
Description: |
![]() |
Raman scattering spectrometer Renishaw in Via Spectrometer with accessories
Description: |
![]() |
Device for replication of holograms
Description: |
![]() |
dynamic microhardness meter
Description: |
![]() |
vacuum evaporation unit
Description: |
![]() |
Spincoater, hotplate and UV curing lamp for formation of thin films
Description: |
![]() |
ICP deep reactive etching system,
Description: |
![]() |
Device for multiplication of holograms
Description: |
![]() |
Laser ellipsometer L115
Description: |
![]() |
Device for roughness measurement of mechanical surfaces
Description: |
![]() |
Langmuir-Blodgett trough and control system
Description: |
![]() |
UV-VIS spektrometer
Description: |
![]() |
Universal optical spectroscopy and laser microfabrications system
Description: |
![]() |
AFM Scanning probe microscopy system JPK NanoWizard 3
Description: |
![]() |
Spectroscopic ellipsometer
Description: |
![]() |
The fiber-optic
spectrometer AvaSpec-2048
Description: |
![]() |
Optical microscope NIKON (analyzer)
Description: |
![]() |
microwave plasma enhanced chemical vapor deposition system
Description: |
![]() |
Device for galvanoplastic multiplication
Description: |
![]() |
Fourier transform infrared spectrometer
Description: |
![]() |