AFM: Scanning probe microscopy system - JPK NanoWizard 3
Description:
The JPK NanoWizard 3 scanning probe microscopy system is used for measuring surface topography and the mechanical, electrical, and magnetic properties of materials in both air and fluids. It is suitable for solids, polymers, biological samples, and molecular characterization, as well as for nanomanipulation and nanolithography. This system supports the development and research of advanced new materials and thin films, and it aids in the control of technological processes at the nanoscale.
The system is installed in a class ISO5 cleanroom.
Keywords:
imaging, atomic force microscopy (AFM), topography, morphology, microscopy
Field of Science:
Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Technical specification:
- Operating modes:
Short description:
material characterization and analysis, microscopy and imaging
material characterization and analysis, microscopy and imaging