MMI

Scanning electron microscope

Description:
Scanning electron microscope

Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)

Description:
Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)

Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800

Description:

Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800

XRD: X-ray diffractometer D8 Discover, Bruker

Description:
X-ray diffractometer D8 Discover, Bruker

KRATOS molecular beam epitaxy system for GaAs with control.

Description:

KRATOS molecular beam epitaxy system for GaAs with control.

Electron beam lithography, electron microscope, energy dispersive spectroscopy

Description:
Electron beam lithography, electron microscope, energy dispersive spectroscopy

Atomic force microscope NT-206

Description:
Atomic force microscope NT-206

Energy dispersive X-Ray analysis

Description:
Energy dispersive X-Ray analysis

Optical and fluorescence microscope

Description:
Optical and fluorescence microscope

Lloyd`s mirror holographic lithography setup.

Description:
Lloyd`s mirror holographic lithography setup.

solar spectra simulator

Description:
solar spectra simulator

vacuum evaporation unit

Description:
vacuum evaporation unit

vacuum evaporation unit

Description:
vacuum evaporation unit

RF reactive ion etching system

Description:
RF reactive ion etching system

ion etching system

Description:
ion etching system

diamond like carbon ion beam synthesis system

Description:
diamond like carbon ion beam synthesis system

Spin coater for the formation of thin layers

Description:
Spin coater for the formation of thin layers

UV laser

Description:
UV laser

Dot-matrix hologram origination system

Description:
Dot-matrix hologram origination system

Device for multiplication of optical security marks MSM-1

Description:
Device for multiplication of optical security marks MSM-1

impedance analyzer

Description:
impedance analyzer

Mask aligner and nanoimprint lithography

Description:
Mask aligner and nanoimprint lithography

picoammeter / bias source

Description:
picoammeter / bias source

Raman scattering spectrometer Renishaw in Via Spectrometer with accessories

Description:
Raman scattering spectrometer Renishaw in Via Spectrometer with accessories

Device for replication of holograms

Description:
Device for replication of holograms

dynamic microhardness meter

Description:
dynamic microhardness meter

vacuum evaporation unit

Description:
vacuum evaporation unit

Spincoater, hotplate and UV curing lamp for formation of thin films

Description:
Spincoater, hotplate and UV curing lamp for formation of thin films

ICP deep reactive etching system,

Description:
ICP deep reactive etching system,

Device for multiplication of holograms

Description:
Device for multiplication of holograms

Laser ellipsometer L115

Description:
Laser ellipsometer L115

Device for roughness measurement of mechanical surfaces

Description:
Device for roughness measurement of mechanical surfaces

Langmuir-Blodgett trough and control system

Description:
Langmuir-Blodgett trough and control system

UV-VIS spektrometer

Description:
UV-VIS spektrometer

Universal optical spectroscopy and laser microfabrications system

Description:
Universal optical spectroscopy and laser microfabrications system

AFM Scanning probe microscopy system JPK NanoWizard 3

Description:
Scanning probe microscopy system JPK NanoWizard 3

Spectroscopic ellipsometer

Description:
Spectroscopic ellipsometer

The fiber-optic spectrometer AvaSpec-2048

Description:
The fiber-optic spectrometer AvaSpec-2048

Optical microscope NIKON (analyzer)

Description:
Optical microscope NIKON (analyzer)

microwave plasma enhanced chemical vapor deposition system

Description:
microwave plasma enhanced chemical vapor deposition system

Device for galvanoplastic multiplication

Description:
Device for galvanoplastic multiplication

Fourier transform infrared spectrometer

Description:
Fourier transform infrared spectrometer