MMI

Quantitative and qualitative surface analysis using X-Ray photoelectron spectroscopy, ion scattering spectroscopy, reflection electron energy loss spectroscopy, angle Resolved XPS (ARXPS) with Ar ion surface eching/cleaning possibility
Description:
null

Keywords:
Rentgeno fotoelektronų spektroskopija,jonų sklaidos spektroskopija,atspindėtų elektronų prarastos energijos spektroskopija,UV spindulių fotoelektronų spektroskopija,X-Ray photoelectron spectroscopy,ion scatering spectroscopy,electron spectroscopy,reflection electron energy loss spectroscopy

Field of Science:
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
XPS: X-Ray photoelectron spectroscopy and Auger electron spectroscopy system - KRATOS XSAM800
XPS: Universal X-Ray photoelectron and ion scatering spectroscopy surface analysis system - ThermoFisher ESCALAB 250Xi
Request form