MMI

Semiconductor surface passivation
Description:
null

Keywords:
semiconductor, surface, passivation

Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
Fiber optic spectrometer - Avantes AvaSpec-2048
FTIR: Fourier transform infrared spectrometer - Bruker Vertex 70
Diamond like carbon ion beam synthesis system
Picoammeter / DC source - Keithley 6487
Dynamic microhardness meter - Fischerscope HM 2000S
Spectroscopic ellipsometer - Semilab GES5E
Raman scattering spectrometer - Renishaw inVia
XPS: Universal X-Ray photoelectron and ion scatering spectroscopy surface analysis system - ThermoFisher ESCALAB 250Xi
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