MMI

AFM: Atomic force microscopy
Description:

null

Keywords:
paviršiaus morfologija,lateralinių,elektrinių,Kelvino jėgų mikroskopija,vaizdinimas,mechaninės savybės,lateral,magnetic,electric forces microscopy,mapping,mechanical properties,nanotechnology

Field of Science:
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
AFM: Atomic force microscope - NT-206
AFM: Scanning probe microscopy system - JPK NanoWizard 3
Request form