XPS: Universal X-Ray photoelectron and ion scatering spectroscopy surface analysis system - ThermoFisher ESCALAB 250Xi
Description:
The ThermoFisher ESCALAB 250Xi is an advanced surface analysis tool designed for both qualitative and quantitative investigations of material surfaces. Utilizing X-ray photoelectron spectroscopy (XPS), ion scattering spectroscopy (ISS), and reflection electron energy loss spectroscopy (REELS), this system provides comprehensive insight into surface chemistry and electronic structure. The addition of angle-resolved XPS (ARXPS) allows for depth profiling, while an Ar ion beam enables precise surface cleaning and etching.
Keywords:
X-Ray photoelectron spectroscopy, ion scatering spectroscopy, electron spectroscopy, reflection electron energy loss spectroscopy, Angle Resolved XPS (ARXPS)
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy, Featured research equipment
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy, Featured research equipment
Technical specification:
- X-Ray Source: Monochromated X-ray (Al anode)
- Element Detection Limits: 0.1% to 5%
- Lateral Resolution (Lens-Defined Area): Adjustable from 20 µm to 900 µm
- High-Resolution Imaging: Spectra from areas as small as ~5 µm
- Sample Temperature Control:
- Heating up to 1000 K
- Cooling down to 77 K
- Vacuum Performance: Better than 5E-10 mbar
- Surface Cleaning/Etching: Ar ion sputtering for surface preparation
Usage area:
material characterization and analysis
material characterization and analysis