XPS: X-Ray photoelectron spectroscopy and Auger electron spectroscopy system - KRATOS XSAM800
Description:
Quantitative and qualitative surface analysis using X-Ray photoelectron spectroscopy and Auger electron spectroscopy
Keywords:
Quantitative and qualitative surface analysis, X-Ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES)
Field of Science:
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy, Featured research equipment
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy, Featured research equipment
Technical specification:
X-ray sorce - double Al/Mg anode. Area of analysis: 10 mm. Elements detection limits from 0.1% to 5%
Usage area:
material characterization and analysis
material characterization and analysis