The X-ray diffraction (XRD) device is designed for both qualitative and quantitative analysis of chemical compounds, offering precise insights into material composition. It enables ab initio crystal structure determination, helping to identify and clarify the atomic arrangement of compounds. The system is also adept at analyzing material microstructures, including crystallite sizes, micro-stress, and the degree of crystallinity. Advanced measurement capabilities include grazing incidence diffraction (GID) for surface analysis, micro-diffraction for localized studies, as well as small-angle reflectometry and high-resolution measurements for detailed material characterization. This versatility makes it an essential tool for research in materials science, chemistry, and solid-state physics.
Keywords:
X-ray diffraction, structure, thin layers, analysis of chemical compounds
Diagnostic and measurement technologies, New materials for high-tech, Technologies for sustainable development and energy
- 2.2 kW X-ray tube with Cu anode
- Parallel beam/ Bragg-Brentano geometry
- Göbel mirror
- 2xGe(022) crystal monochromator
- Rotary absorber
- Scintillation detector
- 1D LynxEye detector
- Eulerian cradle (X, Y, Z, Psi, Phi)
- Chi ir Xi motorized positioning table
- X-ray reflectivity acessory
- Motorized slit accessory
- PATHFINDER optics
material characterization and analysis