MMI

AFM: Atomic force microscope - NT-206
Description:

Atomic force microscope NT-206

Keywords:
AFM, scaning, morphology, topography

Field of Science:
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Technical specification:

operating modes: contact, tapping, non-contact. Lateral magnetic force microscopy. Static / Dynamic force spectroscopy. AFM characteristics: maximum scan field: 15x15μm; measurement matrix to 512x512 pixels, maximum height measurements are 2 micrometers, up to 15 mm in diameter and 5 mm high samples.

Short description:
material characterization and analysis, microscopy and imaging
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