AFM: Atomic force microscope - NT-206
Description:
Atomic force microscope NT-206
Keywords:
AFM, scaning, morphology, topography
Field of Science:
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
ICT technologies, inclusive and creative society, Health technologies, biotechnologies and safe food, New production processes, materials and energy efficiency
Technical specification:
operating modes: contact, tapping, non-contact. Lateral magnetic force microscopy. Static / Dynamic force spectroscopy. AFM characteristics: maximum scan field: 15x15μm; measurement matrix to 512x512 pixels, maximum height measurements are 2 micrometers, up to 15 mm in diameter and 5 mm high samples.
Short description:
material characterization and analysis, microscopy and imaging
material characterization and analysis, microscopy and imaging