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Electron beam lithography, electron microscope, energy dispersive spectroscopy
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KRATOS molecular beam epitaxy system for GaAs with control.
Description: KRATOS molecular beam epitaxy system for GaAs with control. |
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Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800
Description: Ray photoelectron spectroscopy and Auger electron spectroscopy system KRATOS XSAM800 |
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Universal surface analysis system for X-Ray photoelectron spectroscopy, ion scatering spectroscopy, reflection electron energy loss spectroscopy, and angle Resolved XPS (ARXPS)
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