MGMF

Investigation of thin films and (nano, micro) structures
Description:
Analysis services for the surface and structural properties of thin coatings, materials, their composites, and engineering components are provided. Surface imaging is performed using atomic force microscopy (AFM) and optical microscopy, which allow for detailed assessment of topography, roughness, and structural geometry. Optical properties are determined using laser ellipsometry, which provides accurate information about layer thickness, refractive indices, and homogeneity. Spectroscopic studies are performed using UV–Vis–NIR and Raman methods, which allow the identification of material composition, phase state, defects, and functional relationships. The services are suitable for quality control, prototype development, material characterization, and research requiring detailed evaluation of surface and layer parameters.

Keywords:
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Field of Science:
New production processes, materials and energy efficiency
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