Keywords:
Waveguide line, relative permittivity, electromagnetic waves.
Diagnostic and measurement technologies, New materials for high-tech
Laboratory works of electrodynamics 1. Investigation of the optical effects of electromagnetic waves 2. Application of electromagnetic wave diffraction for the investigation of crystal structure testing 3. Measurement of the semiconductor relative permittivity using “cylindrical inhomogeneity” in waveguide line 4. Measurement of the optical parameters and permittivity using Michelson interferometer 5. Investigation of the rectangular waveguide line and its working modes 6. Application of the waveguide line short-circuit and empty-mode methods for materials characterization