Dark field microscope with extras NIKON Eclipse LV100D
Description:
Dark field microscope with extras NIKON Eclipse LV100D
Dark field microscope with extras NIKON Eclipse LV100D
Keywords:
diffused light spectra, dark field
Field of Science:
Diagnostic and measurement technologies
Diagnostic and measurement technologies
Technical specification:
Spectrum resolution: 1.5 nm; measurement boundaries: 400-900 nm
Spectrum resolution: 1.5 nm; measurement boundaries: 400-900 nm
Usage area:
Investigation of nanoparticles in ultra-thin films
Investigation of nanoparticles in ultra-thin films