MGMF

Thin films` deposition controller and monitor Inficon XTM/2
Description:
Thin films` deposition controller and monitor Inficon XTM/2

Keywords:
vacuum, layer thickness, mass, growing velocity

Field of Science:
Diagnostic and measurement technologies
Technical specification:
Device uses voltage of 230 V, can be connected to computer; used for measurement of thin film thickness (from several Angstroms to several micrometers)
Usage area:
Measurement of growing coating thickness in vacuum
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