MGMF
Ellipsometer L117 No.166-AK
Description:
Ellipsometer L117 No.166-AK

Keywords:
polarised light, optical film properties

Field of Science:
Diagnostic and measurement technologies
Technical specification:
Light source: HeNe laser, lightwave length λ=6328Å; accuracy: 2,5Å to 10Å; beam diameter - 1 mm
Usage area:
Measurement of optical film properties
Request form