Atomic force microscope
Description:
Atomic force microscope
Atomic force microscope
Keywords:
AFM, atomic force, microscopy
Field of Science:
Diagnostic and measurement technologies
Diagnostic and measurement technologies
Technical specification:
Scan field: max 50x50 microns, Z axes: 2.8 microns;dedicated Resolution: 0.2 nm; the ability to measure the air and the liquid
Scan field: max 50x50 microns, Z axes: 2.8 microns;dedicated Resolution: 0.2 nm; the ability to measure the air and the liquid
Usage area:
Investigation of surface morphology
Investigation of surface morphology