EEF

Tester for 50b/s to 2.048Mb/s digital circuits
Description:
Tester for 50b/s to 2.048Mb/s digital circuits (E1 G.703, G.704).

Keywords:
E1, G.703, G.704, ITU-T G.821/826, BER, ES, SES, PDH, SDH, Mobile networks

Field of Science:
Diagnostic and measurement technologies, Smart environments and information technology, Technologies for sustainable development and energy
Technical specification:
E1, G.703, G.704, ITU-T G.821/826, BER, ES, SES
Usage area:
E1 testing for mobile and PDH/SDH networks
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