EEF

Temperature test chamber HD-BT-40B
Description:
Temperature test chamber HD-BT-40B

Keywords:
Embedded systems, temperature, operating modes

Field of Science:
Diagnostic and measurement technologies, Smart environments and information technology, Technologies for sustainable development and energy
Technical specification:
The temperature range is not higher than -40 ° C or lower than 150 ° C Capacity of 25 l Defrost in the range from -40 ° C to 150 ° C no longer than 60 minutes. Chilling in the range from 20 ° C to -40 ° C no longer than 60 minutes.
Usage area:
Temperature operating modes of embedded systems
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